By Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki (eds.)
Mathematical strategies in XRay Spectrometry: examine within the Quantitative research of person debris by way of XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of sunshine components by means of XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS suggestions and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, business, and different functions of XRS: program of XRF within the Aluminum (F.R. Feret). XRay Characterization of skinny Films: Grazing occurrence XRay Characterization of fabrics (D.K. Bowen, M. Wormington). WholePattern becoming, part research by means of Diffraction Methods: part identity utilizing WholePattern Matching (D.K. Smith et al.). Polymer purposes of XRD. HighTemperature and NonAmbient purposes of XRD. tension and pressure choice through Diffraction tools, top Broadening research. XRD suggestions and Instrumentation. seventy one extra articles. Index.
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This corresponds to a relatively small volume of the particle from which the characteristic x-rays emerge. On the other hand, maximum intensities for strontium are obtained when the central part of the particle is irradiated. This corresponds to a relatively large volume of the particle from which the characteristic x-rays emerge. We expect that the differences shown in Figure I could be minimized if we incorporate measured x-ray spectral distributions into our Monte Carlo simulations. I. MATHEMATICAL TECHNIQUES IN X-RAY SPECTROMETRY 14 /"'"'..
Copies of the program and a detailed manual (Yager and Quick, 1992) are available from the authors. APPROACH Analysis of EDS X-ray spectra requires (1) correction for detector drift, (2) subtraction of the background continuum, (3) measurement of X-ray peak intensities, and (4) calculation of element abundances and estimation of precision using peak intensities. In SUPERXAP, detector drift is corrected numerically using correction factors obtained on a standard reference spectra, and adjusting subsequent spectra accordingly.
A linear, digital filter can be mathematically constructed to suppress the low- and high-frequency components of spectra but preserves the mid frequency information of the X-ray peaks (McCarthy and Schamber; 1981). The advantage of this approach lies in the fact that background subtraction is independent of the shape of the background continuum and the composition of the sample. Filtered contents of the nth channel, F(n) are calculated by 633 6 F(n)=1/12 [-1": c(n-i) +1": c(n-i) + 1": c(n+i)-1": c(n+i)] i=4 i=l i=l i=4 (4) where c(n) is the number of counts in the nth channel before filtering.